Get a clearer, more complete picture of your materials by combining XPS (X-ray Photoelectron Spectroscopy) with SEM-EDS, bringing together detailed surface chemistry and high-resolution compositional ...
Abstract: This paper will introduce a novel image processing algorithm based on expert knowledge of SEM (Scanning Electron Microscope) image segmentation of integrated circuit (IC) layouts. Our ...
Abstract: In this paper, we describe the novel technique of using leading edge X-ray microscopy (XRM) technology to replace physical cross-sectioning in failure analysis (FA) and 3-dimensional ...
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