Abstract: Map-aided localization using 3D lidar scan points is an essential and fundamental technology in the field of Intelligent Vehicles (IVs) research, which can estimate the position and ...
Nevada quietly signed an agreement earlier this year with a company that collects location data from cellphones, allowing ...
Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...
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