Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
Researchers at Seoul National University and Sejong University published “Interface dipole modulation for gate dielectrics in Field-Effect transistors: a review.” “Interface dipole engineering has ...
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